Overview

This unit will reveal how electron microscopy can be used to determine the structure and chemistry of a material from the micron to the atomic scale. It will cover methods for the determination of atomic structure, chemical composition and bonding, 3D structures, surface morphology and topography, orientation-relationships and electronic and … For more content click the Read More button below.

Offerings

S1-01-CLAYTON-ON-CAMPUS
S1-FF-CLAYTON-FLEXIBLE

Contacts

Chief Examiner(s)

Professor Neil Cameron

Unit Coordinator(s)

Associate Professor Philip Nakashima

Assessment summary

Continuous assessment: 60%

Final assessment: 40%

This unit contains a hurdle requirement that you must achieve to be able to pass the unit. You are required to achieve at least 45% in the total continuous assessment component and at least 45% in the final assessment component. The consequence of not achieving a hurdle requirement is a fail grade (NH) and a maximum mark of 45 for the unit.

Workload requirements

Workload

Other unit costs

Costs are indicative and subject to change.
Electronics, calculators and tools: From 2020 you are required to have a Casio FX-82AU (any version) scientific calculator OR Texas Instruments 30XB scientific calculator - $50. More information

Availability in areas of study

Materials science